Optical Vortex Metrology

The optical vortex metrology (OVM) is a new area in practical optics. OVM uses optical vortices for metrological goals. Although new, it has some important achievements. Two of them have been awarded the Nobel Prize: STED microscopy (2014 in Chemistry) and optical tweezers (2018 in Physics). This presentation is focused on our (Singular Optics Group) research in the field of OVM. The problems of optical vortex interferometry, optical vortex microscopy and vortex applications in optical tweezers will be discussed, in brief.